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BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 By using BS EN 4834

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By using BS EN 4834

General guidelines

c) uniformity of the air kerma rate within a cross-sectional area of the radiation beam

They differ from bolts in that they are often constructed of weaker materials

ISO and other sources

BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 By using BS EN 4834

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