Ge N-type SB-doped (111) 5x5x0.5mm 1sp, R: 0.005-0.01 ohm.cm Ga One battery testing control unit

One battery testing control unit could connect up to 10 battery-and-supercapacitor analyzers

Nc>2x10^18 /cc

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In course of CVD fabrication of graphene hydrogen and methane gases are introduced into a furnace that heats to 1000° Celsius

Please allow 20 - 30 minutes to recover the dew point to -40 C when one person enters the dry room

Ge N-type SB-doped (111) 5x5x0.5mm 1sp, R: 0.005-0.01 ohm.cm Ga One battery testing control unitSpecifications Growing Method: CZ Wafer Size: 5x5x0. 5 mm Surface Polishing: One side epi polished Orientation: (111) Surface roughness: < 8 A ( by AFM) Doping: Sb doped Conductor type: N type Resistivity: 0. 005 0. 01 Ohms cm EPD: N A Package: under 1000 class clean room in wafer container Related Product Other Crystal wafer A Z Plasma Cleaner Wafer Containers Dicing saw Film Coater