Semiconductor devices. Micro-electromechanical devices - Electromechanical tensile test method for conductive thin films on flexible substrates Ingestion-build-59651 This British Standard specifies requirements

This British Standard specifies requirements and test methods for the construction and performance of non-armoured cables with thermosetting insulation of rated voltages 600/1 000 V

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The single document in the first edition of EN 61260:1995 is in EN 61260 series separated into three parts covering: specifications

2 General ambient conditions

Semiconductor devices. Micro-electromechanical devices - Electromechanical tensile test method for conductive thin films on flexible substrates Ingestion-build-59651 This British Standard specifies requirements1 Scope This part of IEC 62047 specifies a tensile test method to measure electromechanical properties of conductive thin micro electromechanical systems (MEMS) materials bonded on non conductive flexible substrates. Conductive thin film structures on flexible substrates are extensively utilized in MEMS, consumer products, and flexible electronics. The electrical behaviours of films on flexible substrates differ from those of freestanding films and