Nanometrics XLS 75 Xenon Light Source 7000-023213 Wafer Thickness Analyzer Spare img{max-width:100%} JEOL P210-X4 Capacitive Gage

img{max-width:100%} JEOL P210-X4 Capacitive Gage Controller ASP-10-PCR WS-51020 JWS-7555S Working

Inventory # A-11962

Part No: 6642C76G21

Shutter Position

NIPPLE TK006-01-N27-0 (Qty

Nanometrics XLS 75 Xenon Light Source 7000-023213 Wafer Thickness Analyzer Spare img{max-width:100%} JEOL P210-X4 Capacitive GageNanometrics XLS 75 Xenon Light Source 7000 023213 Wafer Thickness Analyzer Spare Part No: XLS 75 Untested As Is This Nanometrics XLS 75 is used untested surplus and is being sold as is. The physical condition is good and there are visible signs of previous use and handling. Sale Details Item Condition: Untested Surplus, Sold As Is Estimated Packed Shipping Dimensions: L x W x H = 14"x14"x14" @ 15 lbs. Shipping Terms: All Domestic and International