Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods Ingestion-build-52208 Defence industries

Defence industries

the principles set down can be applied to them

• using communication frequencies that provide a good range even at low transmit power and avoid collisions from disturbers

This document specifies a method for the determination of bending stiffness using the resonance method

and other effects due to chemically and mechanically active sub-stances

Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods Ingestion-build-52208 Defence industries1 Scope This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.