D06800 - SEMI D68 - Test Method for Optical Properties of Electronic Paper Displays StdTpc-Substrate Carriers and Pods Similar requirements and options covering

Similar requirements and options covering load ports for wafers are covered in SEMI E15 (for 200 mm wafers and smaller) and in SEMI E15

This Test Method uses a four-point probe in a manner different from that of other ASTM methods for the measurement of the resistivity or sheet resistance of semiconductors

The use of adapter plates has been shown to reduce the time and cost associated with process equipment installation

SEMI E84-1000 (technical revision)

SEMI E99-1103 (designation update)

D06800 - SEMI D68 - Test Method for Optical Properties of Electronic Paper Displays StdTpc-Substrate Carriers and Pods Similar requirements and options covering1 Purpose 1. 1 Electronic paper displays use reflective technology to create images and need no power to hold images because of their bistable nature. Since there are more and more applications of electronic paper displays on the market nowadays, such as e Book readers, electronic shelf labels, and e Signage, it is necessary to standardize the test method for measuring optical properties of electronic paper displays. 2 Scope 2. 1 This Standard is